intensity of X-ray

Research on quantitative relation between external slanted angle , long axis in illuminate field and intensity of X-ray distribution

探讨外倾角、照射野长轴与X线强度分布的定量关系

Study on the Influence of Excitation Voltage and Anode on the Contribution of Scattering Effects to the Intensity of X-Ray Fluorescence

XRF中激发电位和靶材对散射效应增强荧光强度的影响研究

The effect of atom location confused degree in LiMn_2O_4 on the intensity of X-ray diffraction peak under different conditions was analyzed in theory .

从理论上分析了不同条件下，LiMn2O4中原子占位情况及原子占位混乱度γ对X射线衍射峰强度的影响；

FP method calculates both theoretical intensity of X-ray fluorescence and scattering X-ray intensity of quantitative elements . It is used for many samples and has improved the quantitative analytical accuracy .

FP法对定量元素的荧光X射线进行理论强度计算，同时对散射X射线也进行计算，用于多种样品的定量分析，提高了定量元素准确度。

Conclusion : The intensity of X-ray distribution required is different at the cathode or anode , the various lengths illuminate field of the long axis are corresponded with various external slant angles .

结论：不同尺寸长轴的照射野，均对应于中心线外一定的倾角，获得阴极与阳端不同的X线强度分布值。

With this software , the structure factor can be calculated by means of correcting and normalizing the intensity of X-ray diffraction , and further the distribution function and structural parameters of amorphous alloy can be gotten .

它可以从X射线衍射获得的原始强度数据出发，经过强度的校正和归一化处理，计算出结构因子，进一步求出非晶合金的分布函数和结构参数。

The sources of stresses caused by thermal bonding of GaAs / GaAlAs photocathode to glass and the influences of the crystal stresses on width and intensity of X-ray double crystal diffraction peak are analyzed .

分析了GaAs／GaAlAs阴极粘结工艺中应力产生的根源和晶体中应力对X射线双晶衍射峰的宽度和强度的影响。

The experimental results show that the Ar ~ ( 17 + ) K α - X rays shape has no clear relation with target material , and with increasing the energy of the incident ion , the intensity of X-ray decreases .

实验结果发现Ar17+离子与固体表面作用发射的ArK-αX射线形状与靶材料没有明显的关系，随入射离子能量的增加，K-αX射线强度减小。

A new type of low intensity of X-ray imaging scope ( Lixiscope ) was developed by CUST , that consists of a small x-ray tube , a single proximity focus X-ray image intensifier and a miniature high-voltage power .

我们研制成功的新型低强度X-射线影像仪，是由小型X射线管、单近贴聚焦平板式X-射线影像增强器和小型直流高压电源组成。

The phenomenon of interference is presented when the X-ray beam hits the thin layer sample at glancing angle , the angles corresponding maximal and minimal intensity of x-ray fluorescence are described when the phenomenon of double-beam interference or multiple-beam interference is occurred .

介绍了掠射X射线与薄膜样品作用时产生的干涉现象，给出了X射线双光束干涉和多光束干涉产生极值的条件。

X-ray diffraction ( XRD ) results show that the ( 002 ) face exhibits more intensive diffraction peaks . It demonstrates that the growth of ZnO thin films is c-axis preferred orientation . And intensity of x-ray diffraction peaks and grain sizes increase with annealing temperature .

X射线衍射谱显示，所制备的ZnO薄膜有较强的（002）晶面衍射峰，表明ZnO薄膜为c轴择优取向生长的，并且随着退火温度升高，晶粒逐渐增大，衍射峰逐渐增强。

The Necessity and practicality of the Intensity Correction of X-ray Stress Determination

X射线应力测定强度校正的必要性和实用性

A overall and complete table of intensity correction of X-ray Stress determination is provided .

给出了X射线应力测定强度校正表。

The Experimental Research of Intensity of Grazing-Emission X-Ray Fluorescence Failure to Launch

掠发射X射线荧光强度的实验研究

The results show the accelerating voltage corresponding to maximum intensity of characteristic X-ray of different elements is different .

结果表明：不同元素的特征X射线强度最大值所对应的加速电压不同；

A formula based upon the calculation of relative intensity of fluorescent X-ray is derived and it is relatively simple in application .

同时导出了一个按特征荧光相对强度来计算的公式。其公式在实际应用中更为简便。

On the intensity of mutually-induced X-ray fluorescence between elements

论元素互致X射线荧光辐射强度

When accelerating voltage is maintained , the influence of surface rough degree of specimen on intensity of characteristic X-ray is one of main resons of analysis errors .

当加速电压一定时，表面粗糙对特征X射线强度的影响是造成分析误差的主要原因之一。

The dependence of the intensity of grazing emission X-ray fluorescence on the anode voltage of X-ray tube has been investigated .

文章探讨掠发射X射线荧光强度与X射线管阳极高压的关系。

The linear nonuniformity and nonlinearity of multiple detectors and the nonuniform intensity distribution of the X-ray sector beam result in horizontal striations in the scan image .

其中多个探测器及前放的线性不一致性和非线性以及X射线扇型束流的强度角分布导致图像出现水平条纹和明暗条带。

Development of the high intensity pulse source of soft X-ray for calibration

强脉冲单色软X光标定源的研制

However , when the ball-milling time extends to 2 hours , the intensity of the peaks of X-ray diffraction get broadened and weakened , alloys inclined to amorphization with the extension of milling time .

但随着球磨时间的延长，X射线衍射峰宽化，强度不断降低，合金趋向于非晶化。

And the second-order radiation intensity differential equation which scattering photos tilt in same angle is used to derive the scattering intensity equation of the second-order and higher-order X-ray transmitting parallel . At last , general radiation intensity of continuous spectrum X-ray transmitting into parallel is got .

利用散射光子倾斜同一角度时二次射线的强度微分方程导出了透过平行板的连续谱X射线二次和高次射线辐射强度公式，最终得到透射平行板的连续谱X射线的总强度。