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itrs

  • 网络国际半导体技术蓝图;国际半导体技术路线图
itrsitrs
  1. These results suggest that ITRs may be related to the functional centromeres . 3 .

    这些结果暗示,ITR可能与功能着丝粒有关。

  2. Equivalent realizations of an ITRS The earth 's surface itself serves as the reference space .

    地面基准参考系的等效实现地球表面即可视为基准空间。

  3. In practical BCI Systems , precision and information transfer rates ( ITRs ) are two important factors to measure their performances .

    实际的脑机接口中,正确率和信息传输速率是衡量系统性能的两个主要指标。

  4. Finally , the key design parameters of coating system was obtained , this system can meet ITRS requirements on uniformity of film thickness .

    最后给出了镀膜系统的关键设计参数,此镀膜系统能够满足ITRS关于膜厚均匀性的要求。

  5. These results suggested that the existence of AAV ITRs played an active role for long-term transgene expression even without tans elements .

    这一结果提示我们,在离体条件下,即使没有反式因子的参与,AAVITR序列的存在仍然对转基因的长期表达有着积极的作用。

  6. Itrs really a fast-changing world .

    这真是一个日新月异的世界。

  7. According to the ITRS forecasts in 2009 , the number of transistors on a single chip will reach to 10 billions in 2020 .

    按照ITRS2009年报告预测,到2020年单个芯片上的晶体管数目将达到100亿个。

  8. The concepts and methods to transform space coordinate are studied , transform methods between GCRS and ITRS are derived , advantages , disadvantages and their relations of various transform parameters are analyzed as well .

    研究了空间坐标转换所涉及的概念和方法,分析比较了各种转换方法的优缺点及转换参数之间的关系。

  9. As non-optical Next Generation Lithography ( NGL ) slowly progressing and International Technology Roadmap for Semiconductors ( ITRS ) in acceleration , optical lithography undertaking an important task for IC industry , and further marching into sub-wavelength pattern realm .

    非光学下一代光刻技术的缓慢进展和国际半导体技术发展规划(ITRS)的加速,使光学光刻肩负着IC产业的重任,进一步向亚波长图形领域进军。

  10. AFM may be the most effective instrument to satisfy the demand of ITRS to improve the measurement precision constantly since its observed objects are not limited in nonconductor only . First , the working principle , imaging process , structure and working mode of AFM are studied .

    由于不要求被测样本为非绝缘体,原子力显微镜将可能成为边缘粗糙度测量精度要求不断提高的最有效工具。首先分析了原子力显微镜的工作原理、测量过程、仪器结构和工作模式。