jeol
- 网络日本电子制品
jeol
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The precipitation process was observed by optical metallography and JEOL JEM-2010 electron microscope ( TEM ) .
应用金相显微镜及JEOLJEM2010型高分辨电镜观察了沉淀析出过程。
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The Renishaw SEM-Raman , when installed in the JEOL SEM , pinpoints the exact chemical identities of molecular compositions , making it a powerful materials characterization tool .
当把这种分光仪安装在JEOLSEM上,其就可以准确描述各组成分子的化学结构特征,从而使其成为一种功能强大的材料特性分析工具。
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After a subsequent annealing , the final crystalline products were preliminarily characterized by X-ray diffractometry and then analytical electron microscopy . High resolution lattice images were recorded by JEOL JEM 200 OX electron microscope .
用X射线衍射和分析电子显微镜进行研究,并用高分辨电子显微镜观察,由JEOLJEM200CX获得晶格象照片。