椭圆偏振技术

椭圆偏振技术研究VHF-PECVD高速沉积微晶硅薄膜的异常标度行为

A spectroscopic ellipsometry study of the abnormal scaling behavior of high-rate-deposited microcrystalline silicon films by VHF-PECVD technique

应用掠射式椭圆偏振技术（掠射椭偏术）和循环伏安法对以泡沫镍为基体的表面镀锌电极在碱性电解质（KOH）中的电化学行为进行了研究。

Electrochemical performance of zinc-plated foam nickel electrode in alkaline solution ( KOH ) was stu-died by grazing ellipsometry and cyclic voltammetry .

用反射式动态椭圆偏振光谱技术对Cu块材、Cu薄膜及Cu厚膜的光学常数进行了测试分析。

The optical constants of Cu bulk and sputtering Cu films were studied in details by employing a reflecting spectroscopic ellipsometer .

采用反射式椭圆偏振光谱技术，在可见光区无损伤的测量了小尺寸LGS晶体样品的折射率，拟合了Sellmeier色散方程。

The refractive indices of LGS in visible light region were measured without impairment by the reflection ellipsometry method . The refractive dispersion curve of LGS was fitted to Sellmeier 's equation .

椭圆偏振光谱技术及其对功能薄膜材料的性能表征

Spectroscopic Ellipsometry and Its Characterization on the Properties of Functional Thin Films

与电化学研究方法比较，椭圆偏振测量技术对于检测表面层的微小变化有其独特的优点，在研究抑制铜腐蚀时能弥补电化学研究方法灵敏度不足的缺陷；

Ellipsometry has some special advantages comparing with electrochemical method for study on corrosion system .

椭圆偏振测量技术的发展和应用

Development and application of ellipsometry

C语言在椭圆偏振测厚技术计算中的应用

C Program Applied to Ellipsometry