离子显微镜
- 网络ion microscope
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场离子显微镜原子探针在材料科学中的应用
The application of field ion microscope atom probe for Materials Science
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场离子显微镜及钨晶体表面结构观察
The field ion microscope and the observation of surface structure of tungsten crystal
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嵌段聚合物微相分离后期相区粗化过程的格子Boltzmann研究电场离子显微镜检查法
Study of coarsening of microdomains in block copolymers by lattice Boltzmann methods field ion microscopy
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Fe3Al合金B2有序化过程的场离子显微镜观察
FIM observation on B2 ordering in fe_3al alloy
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Rh(001),(111)和(111)表面被Mo合金化的原子绪构已首次成功地用场离子显微镜直接观察到。
Atomic structure of alloying of Mo on Rh ( 001 ), ( 111 ) and ( 111 ) planes have been directly observed in the field ion microscopy for the first time .
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本文利用场离子显微镜-原子探针(FIM-AP)及电镜研究了具有巨磁电阻效应(GMR)的甩带Cu88Co12合金的微结构。
The microstructure of melt spun Cu 88 Co 12 alloy was studied utilizing transmisson electron microscope ( TEM ) and field ion microscope with atom probe ( FIM AP ) .
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本文叙述了其前半部分,自制SL-1型扫描离子显微镜的原理、设计加工及实验结果。
This paper describes the principle , design , manufacture , and the experimental results of SIM of type SL-1 which is homemade by us .
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场离子显微镜(二)&FIM在表面物理研究中的贡献
Field ionmicroscopy (ⅱ) & contribution of FIM to the surface physics
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氦离子显微镜也用于表面和材料的图形化。
HIM has also been used to pattern surfaces and materials .
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氦离子显微镜无需导电涂层就可以提供极好的成像。
HIM can pro-vide excellent imaging without the need for conductive coatings .
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场离子显微镜观测单壁碳纳米管
Field-ion Microscope Study of Single-walled Carbon Nanotube
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场离子显微镜模式,可以研究表面原子结构,提供具有原子分辨的实空间原子排列信息;
Field Ion Microscope mode , in which information of surface atom structure is obtained ;
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场离子显微镜原子探针系统校正
The Calibration of the Atom Probe System
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含晶界场离子显微镜&原子探针试样的制备技术
Technique on Preparing Test Samples for the Use of Field Ion Microscope Atomprobe Containing Crystal Boundary
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扫描离子显微镜的研究
The research of scanning ion microscope
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电发光显示器;电致发光显示器;场致发光显示器电场离子显微镜检查法
Electroluminescent display field ion microscopy
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场离子显微镜和飞行时间原子探针及其在定量研究固体表面原子微观过程中的应用(一)
Field Ion Microscope and Time-of-Flight Atom Probe and Their Applications to Quantitative Atom Microexamination on Solid Surface ( I )
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束扫描范围2×2mm~2。该枪已用于扫描离子显微镜中。
The beam scanning area is 2 × 2mm ~ 2 . The gun has been applied in a SIM .
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可以使用氦离子显微镜进行离子散射能谱分析,从而将这项灵敏度最高的表面技术应用于同时要求具有空间分辨率的分析任务中。
Ion scattering spectroscopy can be carried out with HIM , allowing this most surface sensitive technique to be applied to analysis tasks where spatial resolution is also required .
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扫描离子显微镜-飞行时间质谱仪(即SIM/ToF-SIMS)的研究是表面分析领域的前沿课题。
The research of SIM / ToF-SIMS instrument is an advanced subject in the field of surface analysis . The Scanning Ion Microscope ( SIM ) is its first part .
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为寻找高强度的相干电子源,我们自主研制了一台集低能电子点源显微镜和场发射/场离子显微镜于一体的设备。
In search for a high-intensity coherent electron source , a facility has been developed that can function as a LEEPS microscope or a field-emission / field ion microscope ( FEM / FIM ) .
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研究人员利用离子显微镜对月球岩石标本中正常氢元素(包含1个中子)与重氢元素(包含2个中子)的含量进行了比较。
The researchers used what 's called an ion microscope to compare the amount of normal hydrogen in the moon rocks to the amount of the hydrogen isotope , which carries an extra neutron .
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这项研究发表在《自然地球科学》期刊上。研究人员利用所谓的离子显微镜来比较月球岩石中正常的氢元素含量及同位素氘的含量,元素氘比卿多带一个中子。
The researchers used what 's called an ion microscope to compare the amount of normal hydrogen in the moon rocks to the amount of the hydrogen isotope deuterium , which carries an extra neutron .
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场离子-扫描隧道显微镜
Field ion & scanning tunneling microscope