衍射强度

从X射线的衍射强度测定晶体的德拜特征温度

The determination of Debye characteristic temperatures of crystals from X-ray diffraction intensities

通过测定高强度绝缘子的热膨胀和X射线衍射强度进行试验。

Tests were carried out by measuring the thermal expansion and the X-ray diffraction intensities of high-tension insulators .

金属单层膜的小角X射线衍射强度的研究

Small angle X ray diffraction of the single metal film

尖晶石类氧化物离子占位与结构参数及X射线衍射强度的关系

The Relationships of Ion Arrangement with Structural Data and XRD Integrated Intensity of Spinel Type Oxide Compounds

该方法以X射线衍射强度分布为基础，而与分布曲线的峥值无关。

This is based on the shape of the intensity distribution and is independent of the peak intensity .

LiB化合物X射线衍射强度计算与晶胞中电子密度分布

XRD intensity calculation and electron density function of Lib compound

电子探针中的X射线衍射强度的理论分析及中间标样法实行的可能性

The Theoretical Analysis of the Diffraction Intensity of X-rays in the Electron Probe and the Feasibility of the Medium Standard Method

Si衬底上分子束外延Ge，Si时的反射式高能电子衍射强度振荡观察

RHEED intensity oscillations in the process of molecular beam epitaxy growth of Ge and Si on Si substrates

同时提出了两种C／C复合材料石墨化度表征的新方法，一是考虑衍射强度的G参数的修正公式；

Two new characterization methods for C / C composites are presented in this paper , one is the revision of parameter G with diffraction intensity ;

液相温度用偏光显微镜和半定量X射线衍射强度外推法两种方法来确定，并且这两种方法测出的结果比较接近。

The liquidus temperatures determined by petrographic microscopy method are in better aggreement with those determined semiquantitatively by the extrapolation method of X-ray diffraction intensity .

考察纳米金刚石团聚的原因，提出和构建纳米金刚石及其颗粒团聚的基本模型。利用X射线的衍射强度，计算得出纳米金刚石的德拜特征温度及其它一些物理参数。

The Debye characteristic temperature and some other physics parameters were calculated according to X-ray diffraction intensities . The reasons of nano-diamond aggregation were discussed and a model is proposed .

同时通过XRD对主峰衍射强度的测定可以确定TiO2重量中各晶型的含量。

At the same time the relative content of anatase and rutile can be determined by the intensity of main peak in TiO2 XRD patterns .

提出了这种膜系内密度变化的简单物理模型，通过理论衍射强度计算和小角X衍射实验证明这种模型是合理的。

This paper presents a simple physical model of change of mass density for calculating the diffraction intensity of multilayer , which is proved by the experiments of the small angle X ray diffraction .

根据X射线衍射强度理论和高聚物的两相模型概念，用计算机分峰法处理了亲水涂层的衍射曲线，计算了相应的衍射积分强度；

Based on the X-ray scattering intensity theory and the double-phase model idea of polymer , the scattering curves of the hydrophilic coating are processed by CPRM , and the corresponding scattering intensities are calculated .

过滤性能良好的浸出渣在XRD图上显示出衍射线的强度与清晰度都较为显著，而过滤性差的浸出渣表现出X射线衍射强度较弱且模糊。

The good filtration leaching residue in the XRD map showing the intensity and clarity of crystalline diffraction lines are more significant ; But the poor filter residue showed X-ray diffraction intensity is weak and vague .

XRD图显示石墨烯的衍射强度相对于石墨和氧化石墨烯来说甚微，说明石墨烯剥落成为单层或者几层结构，从而形成一种新的晶格结构。

The diffraction intensity of graphene was much weaker than that of graphite and graphite oxide , may because graphene was exfoliated to monolayer or a few layers and thus formed a new lattice structure .

X射线平均衍射强度法计算PET结晶度的结果表明，结晶度在轧制形变后大幅下降，然后随加热温度升高和加热时间延长逐渐上升。

The crystallinity of PET in heat treatment process was calculated using the average X-ray diffraction intensity collected by an area detector . The result of calculation reveals that crystallinity decreases drastically during cold rolling and increases gradually during heat treatment .

X射线线宽法计算表明，CeO2纳米粒子越小，晶格畸变越大，晶粒发育越不完整，衍射强度越低。

Calculation of crystallites by Scherrer formula manifests that the smaller the CeO 2 particle , the bigger the crystal lattice distortion , the worse the crystal growth , and the lower the diffraction intensity .

XRD分析和微观组织观察显示，AZ31镁合金变形后锥面衍射强度显著增强，并且镁合金的再结晶速度随着变形温度的升高而显著加快。

XRD analysis and microscopic examination shows that the pyramidal face diffraction intensity enhanced significantly , the recrystallization rate of magne-sium alloy increases obviously with the rise of deformation temperature .

通过用特殊的磨样及采用毛玻璃压样，结合计算拟合修正衍射强度等方法，研究了如何减轻乃至消除闪石族样品X射线图中310择尤取向问题，得出较为理想的结果。

The problems of how to reduce and eliminate 310 preferred orientation of amphibole samples in x - ray diffraction can be solved by the method of calculation fitted with refinement diffraction intensity through the special grinding samples and pressuring samples using frosted glass .

根据MCM－41的X射线粉末衍射强度和六方点阵参数ao随焙烧条件变化的特点，确定了测试无机孔墙厚度的适宜条件。

The appropriate conditions measuring the inorganic pore wall thickness of MCM 41 have been studied according to the variations of the hexagonal lattice parameter , a 0 and X ray power diffration intensities upon calcining .

采用陆学善、梁敬魁提出的方法，利用纳米金刚石的X射线衍射强度，计算出它的德拜特征温度为411.7K，比高温高压合成出的大颗粒金刚石单晶的德拜特征温度（2200K）低了许多；

The melting-point of nano-diamond was reported in this paper . The Debye characteristic temperature of nano-diamond was calculated based on X-ray diffraction intensities by the methods introduced by LU Xue-Shan and LIANG Jing-Kui .

本文导出了直角刻槽反射光栅在正入射和非正入射以及刻槽偏离直角等情况下，反射夫朗和费（Fraunhofer）衍射强度分布表达式；

In this paper , the Intensity function of reflected Fraunhofer diffraction by reflecting grating with right angle grooves has been derived in the cases of the normal incidence and unnormal incidence of rays and the ruled grooves deviated from right angles .

文中考虑了众多因子对衍射强度曲线的影响，提出了一种分离无定形衍射强度的新方法，同时还编写了一个FORTRAN程序，使用微处理机计算结晶度，取得了较满意的结果。

The effect of many factors on the diffraction intensity profile is considered , meanwhile a new method for resolution of amorphous halo is given , and a FORTRAN program is also written for the calculation of crystallinity by the use of microcomputer . The results are satisfactory .

只需测定任一或数条（00l）衍射线加压前后衍射强度比值，即可求出取向度。

The degree of preferred orientation can be obtained by merely determining the ratio of diffraction intensity of any one or more ( 00l ) lines before and after hot-pressing procedure .

合成分子筛中分子筛含量测定方法&三点高度角度差乘法求衍射强度比

Measurement of the crystallinity of synthetic molecular sieves & three point method

对平晶衍射强度公式的讨论

Discussion of Formula on Diffraction Density of Plan Crystal

变栅距光栅衍射强度分布的一般公式及其应用

The General Formula Of The Light Strength Distribution For A Varied-Line Space Grating

通过测量多光束衍射强度，确定了斯托克斯参量。

The Stokes parameters were determined by measuring the multiple beam diffraction intensity .

晶体X光衍射强度与几何结构因子关系研究

Relation of X-ray Diffraction Intensity with the Geometric Structure Factor of a Crystal